Test chambers for evaluating humidity resistance of electronic components Unique environmental chambers for testing electronic components and the semiconductor industry. The chambers address the need for accurate results matching field conditions within a minimal timeframe. The HAST series offers high performance, functionality, and ease of use, conforming to the international standard IEC60068-2-66. Numerous convenient functions and safety features are included for bias testing.
Wet and dry bulb temperature control Available in M chambers according to IEC60068-2-66 standard Temperature and humidity are measured directly using Wet and dry bulb Temperature for precise control of temperature and humidity throughout the entire process. After test completion, temperature and humidity can be reduced for a set time. During Hold, the chamber is maintained in a constant environment until the door is opened and samples are removed. This allows placing a sample in a controlled temperature/humidity environment, preventing drying out after returning to atmospheric pressure. Easy program setting Capacity of 10 programs with 30 steps per program. Simple operation using keys to set programs, adjust temperature, humidity, and time values. Safe and reliable door The system uses an automatic door locking mechanism operated by buttons and prevents door opening when the chamber is pressurized. Automatic Humidifying water supply system At the start of the test, the required humidifying water for that test will be automatically taken from the water tank. A viewing point on the front allows checking the remaining water amount in the tank at a glance. Sample protection measures Standard equipment includes a power supply control terminal producing contact signals to allow voltage and signal application to the sample during testing. When a problem occurs, samples and the chamber are fully protected. Power supply to the sample is stopped, and protection mechanisms against overheating and boil-dry are activated.